ARGOS Accessories
Would you like to flexibly test different optics? Our self-centring holders are ideal for round samples with diameters of up to 45 mm or 203.2 mm (8″). Our customized trays, on the other hand, enable batch measurement of many components. Use our calibration samples to check the sizing at regular intervals.
Expand the Versatility of Your ARGOS
Mounts for Single Component Inspections
A self-centring holder is included with the ARGOS matrix system for flexible and fast single part testing. It enables the individual part inspection of round test specimens up to a diameter of 45 mm. Do you want to inspect larger test specimens? A larger self-centring holder is optionally available for the individual part inspection of round test specimens with a diameter of up to 203.2 mm (8″).
Fixtures for Multipart Inspections
The ARGOS matrix system can also be used to create automated measurements of entire batches of test specimens. This allows you to drastically reduce your handling time compared to single component testing. DIOPTIC offers suitable fixtures with test profiles for this purpose, consisting of a universal adapter and individual inspection trays for holding multiple test specimens. Inspection fixtures are custom-designed and manufactured to match your optical components.
Calibration Samples
The DIOPTIC calibration sample is a proven tool for precision measurement. With precisely manufactured defects, it enables reliable validation of the system and ensures exact sizing. The ARGOS matrix systems are supplied with factory calibration. You can purchase your own calibration sample to validate the size determination at regular intervals on your premises.
Mounts for Single Component Inspections
| Measurement head configuration | Measurement head S | Measurement head M | Measurement head L |
|---|---|---|---|
| Nominal resolution (object-side pixel pitch) | 3.0 µm | 5.0 µm | 7.5 µm |
| Camera field of view | 13.7 mm × 13.7 mm | 22.4 mm × 22.4 mm | 33.6 mm × 33.6 mm |
| Smallest ISO 10110-7 size grade | 0.004 (digs), 0.0025 (scratches) | 0.0063 (digs), 0.004 (scratches) | 0.01 (digs), 0.0063 (scratches) |
| Smallest visible defects1/2 | < 1 µm | < 2 µm | < 3 µm |
| Reproducibility of the size measurement1/3 | < 1.5 µm | < 3 µm | < 4.5 µm |
| Inspection example: 8″ wafer4 | 12 min | 4 min | 2 min |
| Inspection example: Lens, D = 30 mm, R = 30 mm4 | 4 min | 2 min | 15 s |
| Datasheet | Datasheet |
2Smallest visible defects: Small defects will be assigned the minimum grade number 0.0025/0.004/0.0063.
3Reproducibility of the size measurement: Mean standard deviation of measured defect sizes for 30 repetitions with the same calibration sample.
4Inspection duration: The evaluation time depends on the specification and quality of the surface.
Fixtures for Multipart Inspections
| Measurement head configuration | Measurement head S | Measurement head M | Measurement head L |
|---|---|---|---|
| Nominal resolution (object-side pixel pitch) | 3.0 µm | 5.0 µm | 7.5 µm |
| Camera field of view | 13.7 mm × 13.7 mm | 22.4 mm × 22.4 mm | 33.6 mm × 33.6 mm |
| Smallest ISO 10110-7 size grade | 0.004 (digs), 0.0025 (scratches) | 0.0063 (digs), 0.004 (scratches) | 0.01 (digs), 0.0063 (scratches) |
| Smallest visible defects1/2 | < 1 µm | < 2 µm | < 3 µm |
| Reproducibility of the size measurement1/3 | < 1.5 µm | < 3 µm | < 4.5 µm |
| Inspection example: 8″ wafer4 | 12 min | 4 min | 2 min |
| Inspection example: Lens, D = 30 mm, R = 30 mm4 | 4 min | 2 min | 15 s |
| Datasheet | Datasheet |
2Smallest visible defects: Small defects will be assigned the minimum grade number 0.0025/0.004/0.0063.
3Reproducibility of the size measurement: Mean standard deviation of measured defect sizes for 30 repetitions with the same calibration sample.
4Inspection duration: The evaluation time depends on the specification and quality of the surface.
ARGOS Family of Inspection Solutions
More Products