WAVOS cover

WAVOS – Inspection of wavefront and beam deflection

WAVOS characterizes light fields transmitting through optical elements.
It is used to evaluate the quality of optical components made from glass or plastics. WAVOS combines the precise measurement of beam deflection field and wavefront with wide scanning range and high lateral resolution which makes WAVOS a versatile tool for form inspection of optical components at various customizable wavelengths.

Are you interested in further information about automated, wavefront and defection field measurement? Get in touch with our experts!

Our Sales Team (sales@dioptic.de) is happy to assist you. | Phone: +49 6201 960 90-20

↓ WAVOS cover
↓ WAVOS cap
↓ WAVOS custom

Beam deflection measurements for characterization of lidar covers showing: molding artefacts (left) and the impact of heating wires (right).
Beam deflection measurements for characterization of lidar covers showing: Molding artefacts (left) and the impact of active heating wires (right).

WAVOS cover

WAVOS cover is designed to measure transmitted light deflection fields. The measurement spatially resolves the angle of transmitted light changed by optical elements (e.g. LiDAR covers glasses or windows). Applications range from optimization and testing of components during LiDAR development, pass-fail quality control in pre-production of a couple hundred pieces per month, and up to full in-line pass-fail control for mass production with over 1 Mio units per year.
WAVOS cover can be adapted to various needs regarding illumination wavelength, sample geometry or automated batch inspection.

Get more information about WAVOS cover in our product sheet.

WAVOS cap

360-degree inspection of cylindrical samples or domes is performed with WAVOS cap. The combination of a the WAVOS sensor head with a precise rotation stage allows for automated inspection of almost arbitrarily shaped protection caps!


WAVOS custom

The WAVOS sensor measures reflected and transmitted deflection fields and wavefront. We adapt the WAVOS system and software in terms of sample size, working wavelength, quantity and function to your needs in order to inspect quality of your optical elements in the best and most precise way. Integrated self-referencing and automated report generation simplifies the inspection process and ensures stable quality.

Are you interested in further information about automated, wavefront and defection field measurement?

Our Sales Team (sales@dioptic.de) is happy to assist you. | Phone: +49 6201 960 90-20